Advanced measurement systems for form, surface and defect metrology in critical applications.
We create accurate, fast, non-contact metrology systems for manufacturing and R&D environments.
These include optical coordinate measuring machines, white light interferometers and machine vision systems for surface quality inspection.
View our CMMs View our Vision SystemsFast, accurate, non-contact dimensional measurement for quality control and R&D.
Improved capabilities for the investigation and control of surface structure.
Objective measurement of defects on precision components.
Removing subjectivity, boosting throughput and delivering real cost savings – We helped leading Optics company, Crystran, optimise their Scratch Dig optical surface inspection.
Read case studyWe’re helping organisations all over the world reap the benefits of world-leading metrology. Speak to our experts.
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