Metrology for Good.

Advanced measurement systems for form, surface and defect metrology in critical applications.

We create accurate, fast, non-contact metrology systems for manufacturing and R&D environments.

These include optical coordinate measuring machines, white light interferometers and machine vision systems for surface quality inspection.

View our CMMs View our Vision Systems

Form Metrology

Fast, accurate, non-contact dimensional measurement for quality control and R&D.

Surface Metrology

Improved capabilities for the investigation and control of surface structure.

Defect Metrology

Objective measurement of defects on precision components.

Optical Surface Quality and Scratch-Dig Inspection

Removing subjectivity, boosting throughput and delivering real cost savings – We helped leading Optics company, Crystran, optimise their Scratch Dig optical surface inspection.

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